X-RAY SPECTROMETRY《X射线光谱法》(双月刊). XRS covers the theory and application of X-Ray Spectrometry using electron, x-ray photon, proton, γ and γ-x sources. XRS focuses on advances in techniques, methods and equipment including data handling methods, wavelength and energy dispersion systems.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA《电子光谱及相关现象杂志》(一年八期). The journal encourages contributions in the general area of atomic, molecular, ionic, liquid and solid state spectroscopy carried out using electron impact, synchrotron radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron radiation, Free Electron Lasers, laboratory lasers or other sources of ionizing radiation, combined with electron velocity analysis are especially welcome. The materials properties addressed include characterization of ground and excited state properties as well as time resolved electron dynamics.